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dc.contributor.author李新滿zh_TW
dc.contributor.authorShin-Maan Leeen_US
dc.contributor.authorCharles A. Harlowen_US
dc.date.accessioned2017-10-06T06:18:05Z-
dc.date.available2017-10-06T06:18:05Z-
dc.date.issued1974-03en_US
dc.identifier.urihttp://hdl.handle.net/11536/137501-
dc.description.abstractAlgorithms are preaented for generating minimum multiple-fault detection test lets for fan-out free networks and nonredundant two-level networks. A test set is minimum in the sense that there is no set with a smaller number of test patterns that detects all the faults in the network.en_US
dc.language.isoen_USen_US
dc.publisher交大學刊編輯委員會zh_TW
dc.titleMinimum Test Sets for Fan-Out Free Networks and Two-Level Networksen_US
dc.typeCampus Publicationsen_US
dc.identifier.journal交大學刊zh_TW
dc.identifier.journalSCIENCE BULLETIN NATIONAL CHIAO-TUNG UNIVERSITYen_US
dc.citation.volume7en_US
dc.citation.issue1en_US
dc.citation.spage26en_US
dc.citation.epage34en_US
顯示於類別:交大學刊


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