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dc.contributor.authorLiu, Wen-Jiunnen_US
dc.contributor.authorFeng, Kai-Tenen_US
dc.date.accessioned2014-12-08T15:19:33Z-
dc.date.available2014-12-08T15:19:33Z-
dc.date.issued2009en_US
dc.identifier.isbn978-1-4244-4147-1en_US
dc.identifier.issn1930-529Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/13923-
dc.description.abstractThe void problem causing the routing failure is the main challenge of the greedy routing in the wireless sensor networks. The current research work still can not fully deal with the void problem since the excessive control overheads should be consumed so as to guarantee the delivery of packets. In our previous work, a greedy anti-void routing (GAR) protocol is proposed to solve the void problem with increased routing efficiency by exploiting the boundary finding technique for the unit disk graph (UDG). The proposed rolling-ball UDG boundary traversal (RUT) is employed to completely guarantee the delivery of packets from the source to the destination node under the UDG network. However, the realization of the GAR scheme is not trivial since there can be considerable efforts required in order to realize the continuous rolling ball mechanism of the RUT scheme. In this paper, the boundary map (BM) and the indirect map searching (IMS) scheme are therefore proposed as efficient algorithms for the realization of the RUT technique. After the realization of the GAR protocol, the extensive simulations are conducted and compared with the existing localized routing algorithms. The simulation results show that the proposed GAR protocol can provide better routing efficiency.en_US
dc.language.isoen_USen_US
dc.subjectGreedy routingen_US
dc.subjectvoid problemen_US
dc.subjectunit disk graphen_US
dc.subjectlocalized algorithmen_US
dc.subjectwireless sensor networken_US
dc.titleRealization of Greedy Anti-Void Routing Protocol for Wireless Sensor Networksen_US
dc.typeArticleen_US
dc.identifier.journalGLOBECOM 2009 - 2009 IEEE GLOBAL TELECOMMUNICATIONS CONFERENCE, VOLS 1-8en_US
dc.citation.spage2015en_US
dc.citation.epage2020en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000280579100334-
Appears in Collections:Conferences Paper