應用新型抗輻射單元的超大型積體設計流程及軟錯誤量測之實驗系統

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	楊朝光	zh_TW
dc.contributor.author	闕河鳴	zh_TW
dc.contributor.author	Yang, Chao-Guang	en_US
dc.contributor.author	Chiueh, Herming	en_US
dc.date.accessioned	2018-01-24T07:38:07Z	-
dc.date.available	2018-01-24T07:38:07Z	-
dc.date.issued	2015	en_US
dc.identifier.uri	http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070250720	en_US
dc.identifier.uri	http://hdl.handle.net/11536/139540	-
dc.language.iso	en_US	en_US
dc.subject	由設計抗輻射	zh_TW
dc.subject	抗輻射單元	zh_TW
dc.subject	超大型積體設計流程	zh_TW
dc.subject	測試模型	zh_TW
dc.subject	重離子	zh_TW
dc.subject	單粒子翻轉	zh_TW
dc.subject	移位暫存器	zh_TW
dc.subject	系統晶片	zh_TW
dc.subject	radiation hardness by design	en_US
dc.subject	radiation-hardened cell	en_US
dc.subject	VLSI design flow	en_US
dc.subject	test pattern	en_US
dc.subject	heavy ion	en_US
dc.subject	single-event upset	en_US
dc.subject	shift registers	en_US
dc.subject	system-on-chip	en_US
dc.title	應用新型抗輻射單元的超大型積體設計流程及軟錯誤量測之實驗系統	zh_TW
dc.title	VLSI Design Flow with Radiation-Hardened Cells and Its Experimental System for Soft-Error Measurement	en_US
dc.type	Thesis	en_US
dc.contributor.department	電機工程學系	zh_TW
顯示於類別：	畢業論文