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dc.contributor.author蔡長霖zh_TW
dc.contributor.author吳凱強zh_TW
dc.contributor.authorTsai, Chamg-Linen_US
dc.contributor.authorWu, Kai-Chiangen_US
dc.date.accessioned2018-01-24T07:38:18Z-
dc.date.available2018-01-24T07:38:18Z-
dc.date.issued2016en_US
dc.identifier.urihttp://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070356125en_US
dc.identifier.urihttp://hdl.handle.net/11536/139756-
dc.description.abstractCircuit performance has been the key design constraint for over a decade. Variable-latency design (VLD) paradigm was proposed for optimizing the overall performance in terms of throughput. In addition, process variations and aging effects manifest themselves as gate delay shifts, and in turn cause variability of circuit timing (timing variability). Required for dealing with the impact of timing variability better, detailed evaluation and analysis of circuit timing for VLD are actually not straightforward. In this paper, we present a systematic methodology for analyzing a VLD circuit, and identifying critical 1-cycle and 2-cycle paths/gates. Based on the criticality analysis, a gate sizing framework using particle swarm optimization (PSO) is pro-posed. Our objective is, in a less pessimistic fashion, making constructed VLD circuits better (less vulnerable to timing variability). The proposed framework is experimentally verified to be runtime-efficient and able to provide promising results. On average, an extra timing slack of 10% can be obtained without lengthening the clock period, and only 4% area overhead is introduced.zh_TW
dc.description.abstractCircuit performance has been the key design constraint for over a decade. Variable-latency design (VLD) paradigm was proposed for optimizing the overall performance in terms of throughput. In addition, process variations and aging effects manifest themselves as gate delay shifts, and in turn cause variability of circuit timing (timing variability). Required for dealing with the impact of timing variability better, detailed evaluation and analysis of circuit timing for VLD are actually not straightforward. In this paper, we present a systematic methodology for analyzing a VLD circuit, and identifying critical 1-cycle and 2-cycle paths/gates. Based on the criticality analysis, a gate sizing framework using particle swarm optimization (PSO) is pro-posed. Our objective is, in a less pessimistic fashion, making constructed VLD circuits better (less vulnerable to timing variability). The proposed framework is experimentally verified to be runtime-efficient and able to provide promising results. On average, an extra timing slack of 10% can be obtained without lengthening the clock period, and only 4% area overhead is introduced.en_US
dc.language.isozh_TWen_US
dc.subject可變動延遲設計zh_TW
dc.subject靜態時序分析zh_TW
dc.subject時序變動zh_TW
dc.subject邏輯匝置換zh_TW
dc.subject粒子群體最佳化zh_TW
dc.subjectVariable-latency designen_US
dc.subjectStatic timing analysisen_US
dc.subjectTiming variabilityen_US
dc.subjectGate sizingen_US
dc.subjectParticle swarm optimizationen_US
dc.title針對可變動延遲設計時序變動之分析及最佳化zh_TW
dc.titleAnalysis and Optimization of Variable-Latency Designs in the Presence of Timing Variabilityen_US
dc.typeThesisen_US
dc.contributor.department資訊科學與工程研究所zh_TW
Appears in Collections:Thesis