| 標題: | 新穎共焦顯微術-使用色像差與位置敏感偵測技術 Advanced confocal microscopy utilizing the chromatic aberration and position sensitive detection |
| 作者: | 許嘉桓 詹明哲 Hsu, Chia-Huan Chan, Ming-Che 照明與能源光電研究所 |
| 關鍵字: | 共焦顯微術;彩色共焦顯微術;色像差;位置敏感偵測器;Confocal Microscopy;Chromatic Confocal Microscopy;Chromatic Aberration;Position Sensitive Detector |
| 公開日期: | 2016 |
| URI: | http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070358108 http://hdl.handle.net/11536/139994 |
| 顯示於類別： | 畢業論文 |
- 次微米縱向解析度之色差共軛焦顯微鏡 / 邢煒晟;Hsing, Wei-Cheng;詹明哲;Chan, Ming-Che
- Chromatic confocal microscopy to rapidly reveal nanoscale surface/interface topography by position-sensitive detection / Zhuo, Guan-Yu;Hsu, Chia-Huan;Wang, Yen-Hsiang;Chan, Ming-Che
- Mechanical Scan-Free Confocal Microscope by a Broadband Source and Two Balanced Wavelength-to-Space Transformations / Wang, Hsien-Yi;Lin, Bor-Shyh;Lou, Chien-Ya;Chan, Ming-Che
- 利用共焦顯微系統與反褶積理論對螢光奈米樣品進行圖像回解與分析 / 李叡涵;Li, Ruei-Han;吳光雄;Wu, Kaung-Hsiung
- 對稱型波長編碼共軛焦顯微鏡 / 吳立娟;Wu, Li-Chuan;詹明哲;Chen, Ming-Che
- Wide spectral range confocal microscope based on endlessly single-mode fiber / Hubbard, R.;Ovchinnikov, Yu. B.;Hayes, J.;Richardson, D. J.;Fu, Y. J.
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