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dc.contributor.authorHuang, Kou-Jenen_US
dc.contributor.authorHuang, Kou-Yuanen_US
dc.contributor.authorWang, Luke K.en_US
dc.contributor.authorChou, Ying-Liangen_US
dc.contributor.authorHsieh, Yueh-Hsunen_US
dc.contributor.authorHsieh, Shan-Chihen_US
dc.date.accessioned2014-12-08T15:19:42Z-
dc.date.available2014-12-08T15:19:42Z-
dc.date.issued2009en_US
dc.identifier.isbn978-1-4244-3549-4en_US
dc.identifier.issn1098-7576en_US
dc.identifier.urihttp://hdl.handle.net/11536/14000-
dc.description.abstractSimulated annealing (SA) is adopted to detect the parameters of line, circle, ellipse, and hyperbola. The equation of pattern is defined under translation and rotation. The distance from all points to all patterns is defined as the system error. Also we use the minimum error to determine the number of patterns. The parameters of the pattern are learned with probability in SA. The proposed SA parameter detection system can search a set of parameter vectors for the global minimal error. In the seismic experiments, the system can well detect line of direct wave and hyperbola of reflection wave in the real seismic data. In the seismic data processing, the reflection curves on common depth reflection point (CUP) gathers are hyperbolic patterns. So using SA, the parameters of each hyperbolic pattern can be detected. The parameters are used to calculate the root-mean-squared velocity V(rms). The V(rms) is used to the normal-moveout (NMO) correction and stacking to reconstruct the image of the subsurface. Using the result of SA hyperbolic parameter detection, it is a novel method in the seismic velocity analysis.en_US
dc.language.isoen_USen_US
dc.titleSimulated Annealing for Pattern Detection and Seismic Analysisen_US
dc.typeArticleen_US
dc.identifier.journalIJCNN: 2009 INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS, VOLS 1- 6en_US
dc.citation.spage3532en_US
dc.citation.epage3539en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000280591601258-
Appears in Collections:Conferences Paper