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dc.contributor.author俞光隆zh_TW
dc.contributor.author吳凱強zh_TW
dc.contributor.authorYu, Guang-Longen_US
dc.contributor.authorWu, Kai-Chiangen_US
dc.date.accessioned2018-01-24T07:39:05Z-
dc.date.available2018-01-24T07:39:05Z-
dc.date.issued2017en_US
dc.identifier.urihttp://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070356102en_US
dc.identifier.urihttp://hdl.handle.net/11536/140302-
dc.description.abstractCircuit performance has been the key design constraint for over a decade. Variable-latency design (VLD) paradigm was proposed for optimizing the overall performance in terms of throughput. In addition, process variations and aging effects manifest themselves as gate delay shifts, and in turn cause variability of circuit timing (timing variability). Required for dealing with the impact of timing variability better, detailed evaluation and analysis of circuit timing for VLD are actually not straightforward. In this paper, we present a systematic methodology for analyzing a VLD circuit, and identifying critical 1-cycle and 2-cycle paths/gates. After the criticality analysis, a VDD assignment framework based on genetic algorithm (GA) is proposed to minimize the power consumption of VLD. Our objective is making constructed VLD circuits more power-efficient and less vulnerable to timing variability. The proposed framework is experimentally verified to be runtime-efficient and able to provide promising results. On average, 21.73% power reduction is achieved with 8% timing margin, and only 4.6% area overhead is introduced.zh_TW
dc.description.abstractCircuit performance has been the key design constraint for over a decade. Variable-latency design (VLD) paradigm was proposed for optimizing the overall performance in terms of throughput. In addition, process variations and aging effects manifest themselves as gate delay shifts, and in turn cause variability of circuit timing (timing variability). Required for dealing with the impact of timing variability better, detailed evaluation and analysis of circuit timing for VLD are actually not straightforward. In this paper, we present a systematic methodology for analyzing a VLD circuit, and identifying critical 1-cycle and 2-cycle paths/gates. After the criticality analysis, a VDD assignment framework based on genetic algorithm (GA) is proposed to minimize the power consumption of VLD. Our objective is making constructed VLD circuits more power-efficient and less vulnerable to timing variability. The proposed framework is experimentally verified to be runtime-efficient and able to provide promising results. On average, 21.73% power reduction is achieved with 8% timing margin, and only 4.6% area overhead is introduced.en_US
dc.language.isoen_USen_US
dc.subject可變延遲設計zh_TW
dc.subject時序臨界分析zh_TW
dc.subject基因演算法zh_TW
dc.subject功耗降低zh_TW
dc.subjectVariable-latency designen_US
dc.subjectTiming criticality analysisen_US
dc.subjectGenetic algorithmen_US
dc.subjectPower reductionen_US
dc.title雙時序餘裕+雙工作電壓:針對可變延遲設計的動態功耗降低zh_TW
dc.titleDual Timing Margins + Dual Supply Voltages: Dynamic Power Reduction Revisited for Variable-Latency Designsen_US
dc.typeThesisen_US
dc.contributor.department資訊科學與工程研究所zh_TW
Appears in Collections:Thesis