Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 黃昱愷 | zh_TW |
dc.contributor.author | 劉柏村 | zh_TW |
dc.contributor.author | Huang,Yu-Kai | en_US |
dc.contributor.author | Liu,po-tsun | en_US |
dc.date.accessioned | 2018-01-24T07:39:39Z | - |
dc.date.available | 2018-01-24T07:39:39Z | - |
dc.date.issued | 2017 | en_US |
dc.identifier.uri | http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070350555 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/140682 | - |
dc.language.iso | zh_TW | en_US |
dc.subject | 閘極驅動陣列 | zh_TW |
dc.subject | 雙低電位 | zh_TW |
dc.subject | 全時段抗雜訊 | zh_TW |
dc.subject | 多晶矽 | zh_TW |
dc.subject | 負偏壓 | zh_TW |
dc.subject | 閥値電壓回復 | zh_TW |
dc.subject | GOA | en_US |
dc.subject | dual low voltages | en_US |
dc.subject | full-time noise-free | en_US |
dc.subject | a-Si:H | en_US |
dc.subject | negative bias | en_US |
dc.subject | Vth recovering | en_US |
dc.title | 具雙低電位與全時段抗雜訊 高信賴度閘極驅動陣列之研究 | zh_TW |
dc.title | Study on High Reliability Gate Driver on Array With Dual Low Voltage Levels and Full Time Noise Free | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 光電工程研究所 | zh_TW |
Appears in Collections: | Thesis |