具雙低電位與全時段抗雜訊 高信賴度閘極驅動陣列之研究

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	黃昱愷	zh_TW
dc.contributor.author	劉柏村	zh_TW
dc.contributor.author	Huang,Yu-Kai	en_US
dc.contributor.author	Liu,po-tsun	en_US
dc.date.accessioned	2018-01-24T07:39:39Z	-
dc.date.available	2018-01-24T07:39:39Z	-
dc.date.issued	2017	en_US
dc.identifier.uri	http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070350555	en_US
dc.identifier.uri	http://hdl.handle.net/11536/140682	-
dc.language.iso	zh_TW	en_US
dc.subject	閘極驅動陣列	zh_TW
dc.subject	雙低電位	zh_TW
dc.subject	全時段抗雜訊	zh_TW
dc.subject	多晶矽	zh_TW
dc.subject	負偏壓	zh_TW
dc.subject	閥値電壓回復	zh_TW
dc.subject	GOA	en_US
dc.subject	dual low voltages	en_US
dc.subject	full-time noise-free	en_US
dc.subject	a-Si:H	en_US
dc.subject	negative bias	en_US
dc.subject	Vth recovering	en_US
dc.title	具雙低電位與全時段抗雜訊高信賴度閘極驅動陣列之研究	zh_TW
dc.title	Study on High Reliability Gate Driver on Array With Dual Low Voltage Levels and Full Time Noise Free	en_US
dc.type	Thesis	en_US
dc.contributor.department	光電工程研究所	zh_TW
顯示於類別：	畢業論文