紫外光的曝曬及結構性變化對於p型氧化亞錫薄膜電晶體之特性影響

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	何任詮	zh_TW
dc.contributor.author	荊鳳德	zh_TW
dc.contributor.author	He, Ren-Chiuan	en_US
dc.contributor.author	Albert, Chin	en_US
dc.date.accessioned	2018-01-24T07:40:12Z	-
dc.date.available	2018-01-24T07:40:12Z	-
dc.date.issued	2017	en_US
dc.identifier.uri	http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070450151	en_US
dc.identifier.uri	http://hdl.handle.net/11536/141071	-
dc.language.iso	en_US	en_US
dc.subject	p型氧化亞錫薄膜電晶體	zh_TW
dc.subject	高載子遷移率	zh_TW
dc.subject	紫外光照射	zh_TW
dc.subject	應力效果	zh_TW
dc.subject	高介電常數閘極介電質	zh_TW
dc.subject	薄膜電晶體	zh_TW
dc.subject	p-type SnO TFT	en_US
dc.subject	high carrier mobility	en_US
dc.subject	UV exposure	en_US
dc.subject	strain effect	en_US
dc.subject	High K gate dielectric	en_US
dc.subject	thin film transistor	en_US
dc.title	紫外光的曝曬及結構性變化對於p型氧化亞錫薄膜電晶體之特性影響	zh_TW
dc.title	Influences of Ultraviolet Exposure and Structural Changes on the Characteristics of p-Type SnO Thin Film Transistors	en_US
dc.type	Thesis	en_US
dc.contributor.department	電子研究所	zh_TW
顯示於類別：	畢業論文