完整後設資料紀錄
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dc.contributor.author詹志宏zh_TW
dc.contributor.author李榮貴zh_TW
dc.contributor.author彭文理zh_TW
dc.contributor.authorChan,Chih-Hungen_US
dc.contributor.authorLi, Rong-Kweien_US
dc.contributor.authorPearn Wen-Leaen_US
dc.date.accessioned2018-01-24T07:41:13Z-
dc.date.available2018-01-24T07:41:13Z-
dc.date.issued2016en_US
dc.identifier.urihttp://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070263324en_US
dc.identifier.urihttp://hdl.handle.net/11536/141628-
dc.description.abstract目前晶圓針測廠相關的排程之研究,大多數以數理模式之推導或系統模擬方式進行排程系統設計,但此類研究內容會有許多的假設與限制,然而在實務的生產應用上,這些假設與限制條件經常會面臨實務各項因素的挑戰。 本論文之研究在透過產品生產排程組合,針對實務生產環境,對晶圓針廠測廠的生產排程提供一套簡易直觀的生產排程模式,兼顧生產週期時間與整體設備效率,以供做晶圓針測廠之生產排程作業參考。zh_TW
dc.description.abstractMost of researches on scheduling for wafer probing process focus on mathematical or simulation model. But the user they need setup some assumptions and constraints to use those models, but some of those assumptions are not so practical in real world. This essay is to study of the production schedule in combination, for practical production environment, and wafer probing production scheduling to provide a simple and intuitive production scheduling model that include the production cycle time and overall equipment effectiveness rate. For wafer probing production scheduling job to reference.en_US
dc.language.isozh_TWen_US
dc.subject生產排程zh_TW
dc.subject排程組合zh_TW
dc.subject整體設備效率zh_TW
dc.subjectProduction schedulingen_US
dc.subjectScheduling combinationen_US
dc.subjectOverall equipment effectivenessen_US
dc.title晶圓測試生產排程改善之研究-以I公司為例zh_TW
dc.titleWafer Probing Production Scheduling Improvement - A Case on Company Ien_US
dc.typeThesisen_US
dc.contributor.department管理學院工業工程與管理學程zh_TW
顯示於類別:畢業論文