标题: 异常霍尔效应应用于自旋电子散射氢气感测器之研究
Study of hydrogen sensor based on Anomalous Hall Effect
作者: 周佑融
曾院介
Chou, Yu-Jung
Tseng, Yuan-Chieh
材料科学与工程学系所
关键字: 自旋电子元件;异常霍尔效应;氢气感测器;spintronics device;Anomalous Hall effect;hydrogen gas sensor
公开日期: 2017
摘要: 本研究藉由量测异常霍尔效应电阻(RHall, Rxy)之变化以感测氢气压力。为探讨材料薄膜性质对氢气感测的影响,实验制备[Co(t)/Pd(t)]n之试片。当t=1nm且n=10,13,17,20,可观察试片厚度与不同堆叠数材料磁性异向性对氢气感测能力之变化。另外分别在t=1,2,4nm,n=20,10,5,可观察Co膜厚与介面数对于氢气感测之影响。实验结果发现试片厚度参数最为影响氢气气体感测能力,[Co(1)/Pd(1)]10试片尽管厚度仅为[Co(1)/Pd(1)]20试片的二分之一,但霍尔电阻变化量为其之近12倍。而异向性对感测能力的影响在外加磁场下,垂直异向性试片在无磁场下有最大之电阻变化量,而水平异向性试片则在外加磁场2700 Oe有最大之变化量。在最大水平异向性[Co(4)/Pd(4)]5试片产生AMR贡献项,反使氢气反应量降低。而与传统电阻率(Resistivity, Rxx)变化氢气感测器比较,Rxy约大于Rxx变化量一个级数,可证明其潜在应用价值。
In this research, hydrogen sensors were fabricated and their performance was examined by measuring Anomalous Hall Effect resistance (RHall, Rxy). We deposited two series of [Co(t)/Pd(t)]n multi-layer samples : First series is fixing the thickness of each layer but varying stacking number (t = 1nm and n=10,13,17,20). Second series is fixing total thickness to be 40 nm but varying the number of interfaces (t=1,2,4 nm for n=20,10,5, respectively).This is to observe the effects of sample thickness, magnetic anisotropy, and stacking on hydrogen sensing. The result shows that sample thickness is the primary factor for hydrogen-sensing. Though the thickness of sample [Co(1)/Pd(1)]10 is half to that of sample [Co(1)/Pd(1)]20 , the resistance response is about 12 times bigger. For magnetic anisotropy, sample with perpendicular magnetic anisotropy (PMA) has the most significant response without a magnetic field, while sample with in-plane magnetic anisotropy (IMA) becomes most sensitive in the presence of a magnetic field. However, for IMA [Co(4)/Pd(4)]5 sample, its AMR effect is significant and thus that the ability of hydrogen-sensing is reduced. In comparison with traditional resistivity-type (Rxx) sensors, the proposed sensors exhibit superior performance by a factor of ten. This thereby demonstrates its potential in sensor technology.
URI: http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070451507
http://hdl.handle.net/11536/142136
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