Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 簡伯豪 | zh_TW |
| dc.contributor.author | 闕河鳴 | zh_TW |
| dc.contributor.author | Chien, Po-Hao | en_US |
| dc.contributor.author | Chiueh, Herming | en_US |
| dc.date.accessioned | 2018-01-24T07:41:54Z | - |
| dc.date.available | 2018-01-24T07:41:54Z | - |
| dc.date.issued | 2016 | en_US |
| dc.identifier.uri | http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070250712 | en_US |
| dc.identifier.uri | http://hdl.handle.net/11536/142184 | - |
| dc.language.iso | en_US | en_US |
| dc.subject | 抗輻射靜態隨機存取記憶體 | zh_TW |
| dc.subject | 錯誤更正碼 | zh_TW |
| dc.subject | 記憶體刷新 | zh_TW |
| dc.subject | 內建自我測試 | zh_TW |
| dc.subject | 重離子 | zh_TW |
| dc.subject | 單粒子翻轉 | zh_TW |
| dc.subject | 衛星應用 | zh_TW |
| dc.subject | radiation-hardened SRAM | en_US |
| dc.subject | error-correction code (ECC) | en_US |
| dc.subject | memory scrubbing | en_US |
| dc.subject | built-in self-test (BIST) | en_US |
| dc.subject | heavy ion | en_US |
| dc.subject | single-event upset (SEU) | en_US |
| dc.subject | satellite application | en_US |
| dc.title | 利用錯誤更正碼設計與實作之衛星應用可容忍軟性錯誤靜態隨機存取記憶體 | zh_TW |
| dc.title | Soft-Error Resilient SRAM by Error-Correction Code Design and Implementation for Satellite Application | en_US |
| dc.type | Thesis | en_US |
| dc.contributor.department | 電機工程學系 | zh_TW |
| Appears in Collections: | Thesis | |

