1. You are Here：

Full metadata record
DC FieldValueLanguage
dc.contributor.author呂榮哲zh_TW
dc.contributor.author林鴻志zh_TW
dc.contributor.author黃調元zh_TW
dc.contributor.authorLyu, Rong-Jheen_US
dc.contributor.authorLin, Horng-Chihen_US
dc.contributor.authorHuang, Tiao-Yuanen_US
dc.date.accessioned2018-01-24T07:43:09Z-
dc.date.available2018-01-24T07:43:09Z-
dc.date.issued2016en_US
dc.identifier.urihttp://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070080106en_US
dc.identifier.urihttp://hdl.handle.net/11536/143170-
dc.language.isoen_USen_US
dc.subject金屬氧化物zh_TW
dc.subject薄膜電晶體zh_TW
dc.subject薄膜輪廓工法zh_TW
dc.subject氧化鋅zh_TW
dc.subject氧化銦鎵鋅zh_TW
dc.subject載子遷移率zh_TW
dc.subject開關電流比zh_TW
dc.subject次臨界擺幅zh_TW
dc.subject積體電路後段主動元件zh_TW
dc.subject源極汲極串聯電阻zh_TW
dc.subject短通道效應zh_TW
dc.subject轉換電導zh_TW
dc.subject邏輯閘zh_TW
dc.subject三維zh_TW
dc.subject反向器zh_TW
dc.subject臨界電壓zh_TW
dc.subject電壓轉換曲線zh_TW
dc.subject雜訊容限zh_TW
dc.subject照光穩定性zh_TW
dc.subjectMetal Oxide (MO)en_US
dc.subjectThin-Film Transistor (TFT)en_US
dc.subjectFilm-Profile Engineering (FPE)en_US
dc.subjectZnOen_US
dc.subjectInGaZnO4 (IGZO)en_US
dc.subjectMobilityen_US
dc.subjectOn/Off Current Ratio (ION/IOFF)en_US
dc.subjectSubthreshold Slope (SS)en_US
dc.subjectBack-End-Of-Line (BEOL)en_US
dc.subjectSource/Drain Series Resistance (RSD)en_US
dc.subjectShort-Channel Effecten_US
dc.subjectTransconductance (GM)en_US
dc.subjectLogic Gate, 3-Dimensional (3D)en_US
dc.subjectInverteren_US
dc.subjectThreshold Voltage (VTH)en_US
dc.subjectVoltage Transfer Curve (VTC)en_US
dc.subjectNoise Marginen_US
dc.subjectLight-Induced Instabilityen_US
dc.title以”薄膜輪廓工法”研製金屬氧化物薄膜電晶體及反向器zh_TW
dc.titleFabrication of Metal-Oxide Thin-Film Transistors and Inverters with “Film Profile Engineering”en_US
dc.typeThesisen_US
dc.contributor.department電子工程學系 電子研究所zh_TW
Appears in Collections:Thesis


Related Contents
Loading...