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dc.contributor.authorChang, Tsu-Chien_US
dc.contributor.authorKuo, Shiou-Yien_US
dc.contributor.authorLian, Jhen-Tingen_US
dc.contributor.authorHong, Kuo-Binen_US
dc.contributor.authorWang, Shing-Chungen_US
dc.contributor.authorLu, Tien-Changen_US
dc.date.accessioned2018-08-21T05:52:42Z-
dc.date.available2018-08-21T05:52:42Z-
dc.date.issued2017-11-01en_US
dc.identifier.issn1882-0778en_US
dc.identifier.urihttp://dx.doi.org/10.7567/APEX.10.112101en_US
dc.identifier.urihttp://hdl.handle.net/11536/143883-
dc.description.abstractWe report GaN-based vertical-cavity surface-emitting lasers (VCSELs) capable of high-temperature operation. The GaN-based VCSELs include double dielectric distributed Bragg reflectors and epitaxially grown p-i-n InGaN multiple-quantum-well active layers initially deposited on c-plane sapphire substrates that are bonded to a silicon substrate with a p-side-down and patterned mirror configuration, allowing effective heat dissipation. GaN-based VCSELs with an emission aperture 10 mu m in diameter were fabricated, and their temperature-dependent lasing characteristics revealed that the VCSELs can endure 350 K, as measured under quasicontinuous-wave operation conditions. The temperature-dependent lasing wavelength shift occurs at a rate of d lambda(FP)/dT approximate to 0.012nm/K. The high-temperature operation of GaN-based VCSELs was attributed to the well-matched gain-mode offset, the p-side-down configuration, and the reduced lateral size of the bottom distributed Bragg reflector with recessed metal. (C) 2017 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleHigh-temperature operation of GaN-based vertical-cavity surface-emitting lasersen_US
dc.typeArticleen_US
dc.identifier.doi10.7567/APEX.10.112101en_US
dc.identifier.journalAPPLIED PHYSICS EXPRESSen_US
dc.citation.volume10en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000412337900001en_US
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