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dc.contributor.authorOlaya, Danielen_US
dc.contributor.authorHurtado-Morales, Mikelen_US
dc.contributor.authorGomez, Danielen_US
dc.contributor.authorAlejandro Castaneda-Uribe, Octavioen_US
dc.contributor.authorJuang, Zhen-Yuen_US
dc.contributor.authorHernandez, Yennyen_US
dc.date.accessioned2018-08-21T05:52:48Z-
dc.date.available2018-08-21T05:52:48Z-
dc.date.issued2018-01-01en_US
dc.identifier.issn2053-1583en_US
dc.identifier.urihttp://dx.doi.org/10.1088/2053-1583/aa90d8en_US
dc.identifier.urihttp://hdl.handle.net/11536/143967-
dc.description.abstractNanostructured materials have emerged as an alternative to enhance the figure of merit (ZT) of thermoelectric (TE) devices. Graphene exhibits a high electrical conductivity (in-plane) that is necessary for a high ZT; however, this effect is countered by its impressive thermal conductivity. In this work TE layered devices composed of electrochemically exfoliated graphene (EEG) and a phonon blocking material such as poly (3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT:PSS), polyaniline (PANI) and gold nanoparticles (AuNPs) at the interface were prepared. The figure of merit, ZT, of each device was measured in the cross-plane direction using the Transient Harman Method (THM) and complemented with AFM-based measurements. The results show remarkable high ZT values (0.81 < ZT < 2.45) that are directly related with the topography, surface potential, capacitance gradient and resistance of the devices at the nanoscale.en_US
dc.language.isoen_USen_US
dc.subjectthermoelectricsen_US
dc.subjectgraphene heterostructuresen_US
dc.subjectsolution processingen_US
dc.titleLarge thermoelectric figure of merit in graphene layered devices at low temperatureen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/2053-1583/aa90d8en_US
dc.identifier.journal2D MATERIALSen_US
dc.citation.volume5en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000413544100002en_US
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