標題: | Robust terahertz polarizers with high transmittance at selected frequencies through Si wafer bonding technologies |
作者: | Yu, Ting-Yang Chi, Nai-Chen Tsai, Hsin-Cheng Wang, Shiang-Yu Luo, Chih-Wei Chen, Kuan-Neng 電子物理學系 電子工程學系及電子研究所 Department of Electrophysics Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1-Dec-2017 |
摘要: | Terahertz (THz) polarizers with robust structure and high transmittance are demonstrated using 3D-integrated circuit (IC) technologies. A Cu wire-grid polarizer is sealed and well protected by Si-bonded wafers through a low-temperature eutectic bonding method. Deep reactive-ion etching is used to fabricate the anti-reflection (AR) layers on outward surfaces of bonded wafers. The extinction ratio and transmittance of polarizers are between 20 dB and 33 dB, and 13 dB and 27 dB for 10 mu m and 20 mu m pitch wire-grids, respectively, and 100% at central frequency, depending on frequency and AR layer thickness. The process of polarizer fabrication is simple from mature semiconductor manufacturing techniques that lead to high yield, low cost, and potential for THz applications. (C) 2017 Optical Society of America |
URI: | http://dx.doi.org/10.1364/OL.42.004917 http://hdl.handle.net/11536/144168 |
ISSN: | 0146-9592 |
DOI: | 10.1364/OL.42.004917 |
期刊: | OPTICS LETTERS |
Volume: | 42 |
起始頁: | 4917 |
結束頁: | 4920 |
Appears in Collections: | Articles |