完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Martin, Sebastien | en_US |
dc.contributor.author | Choi, Charles T. M. | en_US |
dc.date.accessioned | 2018-08-21T05:53:01Z | - |
dc.date.available | 2018-08-21T05:53:01Z | - |
dc.date.issued | 2017-12-05 | en_US |
dc.identifier.issn | 1932-6203 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1371/journal.pone.0188993 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/144181 | - |
dc.description.abstract | Objective Electrical Impedance Tomography (EIT) is a powerful non-invasive technique for imaging applications. The goal is to estimate the electrical properties of living tissues by measuring the potential at the boundary of the domain. Being safe with respect to patient health, non-invasive, and having no known hazards, EIT is an attractive and promising technology. However, it suffers from a particular technical difficulty, which consists of solving a nonlinear inverse problem in real time. Several nonlinear approaches have been proposed as a replacement for the linear solver, but in practice very few are capable of stable, high-quality, and real-time EIT imaging because of their very low robustness to errors and inaccurate modeling, or because they require considerable computational effort. Methods In this paper, a post-processing technique based on an artificial neural network (ANN) is proposed to obtain a nonlinear solution to the inverse problem, starting from a linear solution. While common reconstruction methods based on ANNs estimate the solution directly from the measured data, the method proposed here enhances the solution obtained from a linear solver. Conclusion Applying a linear reconstruction algorithm before applying an ANN reduces the effects of noise and modeling errors. Hence, this approach significantly reduces the error associated with solving 2D inverse problems using machine-learning-based algorithms. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A novel post-processing scheme for two-dimensional electrical impedance tomography based on artificial neural networks | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1371/journal.pone.0188993 | en_US |
dc.identifier.journal | PLOS ONE | en_US |
dc.citation.volume | 12 | en_US |
dc.contributor.department | 分子醫學與生物工程研究所 | zh_TW |
dc.contributor.department | 資訊工程學系 | zh_TW |
dc.contributor.department | 電機工程學系 | zh_TW |
dc.contributor.department | Institute of Molecular Medicine and Bioengineering | en_US |
dc.contributor.department | Department of Computer Science | en_US |
dc.contributor.department | Department of Electrical and Computer Engineering | en_US |
dc.identifier.wosnumber | WOS:000417110700036 | en_US |
顯示於類別: | 期刊論文 |