Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wen, Hua-Chiang | en_US |
dc.contributor.author | Chou, Wu-Ching | en_US |
dc.contributor.author | Lin, Shiuan Huei | en_US |
dc.contributor.author | Jiang, Don Son | en_US |
dc.date.accessioned | 2018-08-21T05:53:03Z | - |
dc.date.available | 2018-08-21T05:53:03Z | - |
dc.date.issued | 2017-12-01 | en_US |
dc.identifier.issn | 0026-2714 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/j.microrel.2017.05.037 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/144218 | - |
dc.description.abstract | As an approach to increasing their reliability, we doped Ag solder bumps with Pd and Au alloys to enhance their creep resistance, which we characterized using a nanoindentation technique. The hardnesses of the pure Ag and the Ag solders doped with Pd:3%, Pd:5%, and Pd:2%-Au:3% were 0.6 +/- 0.1, 1.8 +/- 02, 2.8 +/- 03, and 3.1 +/- 0.5 GPa, respectively. Although the hardness of the Ag solder was enhanced significantly when it contained Pd:2%-Au:3%, it exhibited a lower creep exponent (n > 2). The mechanism of the thermal recovery of the sample appears to be associated with activation of dislocation sources-also the reason for the decrease in hardness. The compounds doped with Pd:2%-Au:3% displayed significantly greater bond strengths and creep exponents, whereas the Pd only compounds exhibited poorer reliability. (C) 2017 Elsevier Ltd. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Ag solder | en_US |
dc.subject | Thermal treatment | en_US |
dc.subject | Nanoindentation | en_US |
dc.subject | Hardness | en_US |
dc.subject | Creep | en_US |
dc.subject | Strength | en_US |
dc.title | Nanomechanical properties of Ag solder bumps doped with Pd and Au | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.microrel.2017.05.037 | en_US |
dc.identifier.journal | MICROELECTRONICS RELIABILITY | en_US |
dc.citation.volume | 79 | en_US |
dc.citation.spage | 270 | en_US |
dc.citation.epage | 275 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000417774400031 | en_US |
Appears in Collections: | Articles |