完整後設資料紀錄
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dc.contributor.authorWen, Hua-Chiangen_US
dc.contributor.authorChou, Wu-Chingen_US
dc.contributor.authorLin, Shiuan Hueien_US
dc.contributor.authorJiang, Don Sonen_US
dc.date.accessioned2018-08-21T05:53:03Z-
dc.date.available2018-08-21T05:53:03Z-
dc.date.issued2017-12-01en_US
dc.identifier.issn0026-2714en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.microrel.2017.05.037en_US
dc.identifier.urihttp://hdl.handle.net/11536/144218-
dc.description.abstractAs an approach to increasing their reliability, we doped Ag solder bumps with Pd and Au alloys to enhance their creep resistance, which we characterized using a nanoindentation technique. The hardnesses of the pure Ag and the Ag solders doped with Pd:3%, Pd:5%, and Pd:2%-Au:3% were 0.6 +/- 0.1, 1.8 +/- 02, 2.8 +/- 03, and 3.1 +/- 0.5 GPa, respectively. Although the hardness of the Ag solder was enhanced significantly when it contained Pd:2%-Au:3%, it exhibited a lower creep exponent (n > 2). The mechanism of the thermal recovery of the sample appears to be associated with activation of dislocation sources-also the reason for the decrease in hardness. The compounds doped with Pd:2%-Au:3% displayed significantly greater bond strengths and creep exponents, whereas the Pd only compounds exhibited poorer reliability. (C) 2017 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectAg solderen_US
dc.subjectThermal treatmenten_US
dc.subjectNanoindentationen_US
dc.subjectHardnessen_US
dc.subjectCreepen_US
dc.subjectStrengthen_US
dc.titleNanomechanical properties of Ag solder bumps doped with Pd and Auen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.microrel.2017.05.037en_US
dc.identifier.journalMICROELECTRONICS RELIABILITYen_US
dc.citation.volume79en_US
dc.citation.spage270en_US
dc.citation.epage275en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000417774400031en_US
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