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dc.contributor.authorChien, Jen-Tzungen_US
dc.contributor.authorLee, Chao-Hsien_US
dc.date.accessioned2018-08-21T05:53:11Z-
dc.date.available2018-08-21T05:53:11Z-
dc.date.issued2018-02-01en_US
dc.identifier.issn0162-8828en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TPAMI.2017.2677439en_US
dc.identifier.urihttp://hdl.handle.net/11536/144372-
dc.description.abstractDeep unfolding provides an approach to integrate the probabilistic generative models and the deterministic neural networks. Such an approach is benefited by deep representation, easy interpretation, flexible learning and stochastic modeling. This study develops the unsupervised and supervised learning of deep unfolded topic models for document representation and classification. Conventionally, the unsupervised and supervised topic models are inferred via the variational inference algorithm where the model parameters are estimated by maximizing the lower bound of logarithm of marginal likelihood using input documents without and with class labels, respectively. The representation capability or classification accuracy is constrained by the variational lower bound and the tied model parameters across inference procedure. This paper aims to relax these constraints by directly maximizing the end performance criterion and continuously untying the parameters in learning process via deep unfolding inference (DUI). The inference procedure is treated as the layer-wise learning in a deep neural network. The end performance is iteratively improved by using the estimated topic parameters according to the exponentiated updates. Deep learning of topic models is therefore implemented through a back-propagation procedure. Experimental results show the merits of DUI with increasing number of layers compared with variational inference in unsupervised as well as supervised topic models.en_US
dc.language.isoen_USen_US
dc.subjectDeep unfoldingen_US
dc.subjecttopic modelen_US
dc.subjectvariational inferenceen_US
dc.subjectdeep neural networken_US
dc.subjectunsupervised/supervised learningen_US
dc.titleDeep Unfolding for Topic Modelsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TPAMI.2017.2677439en_US
dc.identifier.journalIEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCEen_US
dc.citation.volume40en_US
dc.citation.spage318en_US
dc.citation.epage331en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000422706000005en_US
Appears in Collections:Articles