統計資料
總造訪次數
| 檢視 | |
|---|---|
| Impacts of plasma-induced damage due to UV light irradiation during etching on Ge fin fabrication and device performance of Ge fin field-effect transistors | 4 |
本月總瀏覽
| 六月 2025 | 七月 2025 | 八月 2025 | 九月 2025 | 十月 2025 | 十一月 2025 | 十二月 2025 | |
|---|---|---|---|---|---|---|---|
| Impacts of plasma-induced damage due to UV light irradiation during etching on Ge fin fabrication and device performance of Ge fin field-effect transistors | 0 | 0 | 0 | 0 | 1 | 1 | 2 |
檔案下載
| 檢視 |
|---|
國家瀏覽排行
| 檢視 | |
|---|---|
| 美國 | 2 |
| 加拿大 | 1 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Buffalo | 2 |
| Ottawa | 1 |