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dc.contributor.authorMartin, Sebastienen_US
dc.contributor.authorChoi, Charles T. M.en_US
dc.date.accessioned2018-08-21T05:53:21Z-
dc.date.available2018-08-21T05:53:21Z-
dc.date.issued2018-03-01en_US
dc.identifier.issn0018-9464en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMAG.2017.2750739en_US
dc.identifier.urihttp://hdl.handle.net/11536/144583-
dc.description.abstractElectrical impedance tomography (EIT) is a patient-safe approach for imaging applications and is a promising technology for biomedical imaging. By applying a small electrical current to living tissue and measuring the electrical potential at different points of the tissue's boundary, it is possible to solve the inverse problem and to generate a map of the tissue's conductivities. Although it is a promising method, the reconstruction process remains a complicated task, and real-time nonlinear image reconstruction algorithms have not yet been widely adopted. Recent studies have proposed the use of artificial neural networks (ANN) to solve the EIT inverse problem. ANNs can give a nonlinear conductivity distribution. Although several studies have examined 2-D finite-element models, very little work has been done on 3-D problems. In this paper, a solution based on the divide-and-conquer method and ANNs is used to solve the nonlinear inverse problem without any linearization. The solution presented here reduces the difficulty of training large ANNs, which are commonly required to solve a 3-D EIT problem with artificial intelligence algorithms.en_US
dc.language.isoen_USen_US
dc.subjectArtificial neural networks (ANN)en_US
dc.subjectcomplexityen_US
dc.subjectelectrical capacitance tomographyen_US
dc.subjectinverse problemsen_US
dc.titleA New Divide-and-Conquer Method for 3-D Electrical Impedance Tomographyen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TMAG.2017.2750739en_US
dc.identifier.journalIEEE TRANSACTIONS ON MAGNETICSen_US
dc.citation.volume54en_US
dc.contributor.department分子醫學與生物工程研究所zh_TW
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentInstitute of Molecular Medicine and Bioengineeringen_US
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000426003900017en_US
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