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dc.contributor.authorLi, Jing-Meien_US
dc.contributor.authorWang, Yu-Tingen_US
dc.contributor.authorHsu, Yung-Jungen_US
dc.date.accessioned2018-08-21T05:53:25Z-
dc.date.available2018-08-21T05:53:25Z-
dc.date.issued2018-03-20en_US
dc.identifier.issn0013-4686en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.electacta.2018.02.015en_US
dc.identifier.urihttp://hdl.handle.net/11536/144676-
dc.description.abstractA more accurate and reliable method is proposed to evaluate the photoelectrochemical (PEC) performance of semiconductor toward water splitting. Conventionally, I-t measurements are conducted at a fixed potential relative to the reference electrode, e.g., 0 V vs. Ag/AgCl, to monitor the photocurrent, which has been regarded as a direct indicator for performance comparison among different electrodes. Considering that the open-circuit potential (OCP) varies from electrode to electrode, the photocurrent comparison at a fixed potential may misrepresent the actual differences between samples. Here, we study the PEC performance by applying two distinct external bias values, one at 0 V vs. Ag/AgCI deriving from the conventional practice and the other at 0.1 V vs. OCP representing the exactly fixed applied overpotential. Two experimental groups are designed to address the arguments, including the influence of heat treatment for ZnO nanorod arrays and the global comparison among ZnO, TiO2, Au particle-decorated TiO2, and CdS electrodes. Different trends in photocurrent are observed at the two distinct biases, with the results from 0.1 V vs. OCP conforming to the general considerations. The results suggest that application of a fixed potential relative to the OCP will provide a more fair comparison for accurate PEC performance evaluation without under-or over-estimation. (C) 2018 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectPhotoelectrochemical water splittingen_US
dc.subjectOpen-circuit potentialen_US
dc.subjectZero-biasen_US
dc.subject0 V vs. Ag/AgClen_US
dc.titleA more accurate, reliable method to evaluate the photoelectrochemical performance of semiconductor electrode without under/over estimationen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.electacta.2018.02.015en_US
dc.identifier.journalELECTROCHIMICA ACTAen_US
dc.citation.volume267en_US
dc.citation.spage141en_US
dc.citation.epage149en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000427382500017en_US
Appears in Collections:Articles