完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Wu, Chih-Chiang | en_US |
dc.contributor.author | Jeng, Shyr-Long | en_US |
dc.date.accessioned | 2018-08-21T05:53:37Z | - |
dc.date.available | 2018-08-21T05:53:37Z | - |
dc.date.issued | 2018-01-01 | en_US |
dc.identifier.issn | 0914-4935 | en_US |
dc.identifier.uri | http://dx.doi.org/10.18494/SAM.2018.1746 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/144934 | - |
dc.description.abstract | In this work, we examined the electrical characteristics of laboratory-fabricated cascode gallium nitride field-effect transistors (GaN FETs) and analyzed their parasitic capacitances. The calculated results were in good agreement with the experimental results and showed that commercial GaN FETs have superior switching performance, whereas laboratory-fabricated GaN FETs require further improvement. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | gallium nitride | en_US |
dc.subject | cascode | en_US |
dc.subject | parasitic capacitance | en_US |
dc.title | Comparison of Parasitic Capacitances of Packaged Cascode Gallium Nitride Field-efect Transistors | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.18494/SAM.2018.1746 | en_US |
dc.identifier.journal | SENSORS AND MATERIALS | en_US |
dc.citation.volume | 30 | en_US |
dc.citation.issue | 1 | en_US |
dc.citation.spage | 453 | en_US |
dc.citation.epage | 461 | en_US |
dc.contributor.department | 機械工程學系 | zh_TW |
dc.contributor.department | Department of Mechanical Engineering | en_US |
dc.identifier.wosnumber | WOS:000431392900015 | en_US |
顯示於類別: | 期刊論文 |