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dc.contributor.authorChen, Hsuan-Anen_US
dc.contributor.authorSun, Hsuen_US
dc.contributor.authorWu, Chong-Rongen_US
dc.contributor.authorWang, Yu-Xuanen_US
dc.contributor.authorLee, Po-Hsiangen_US
dc.contributor.authorPao, Chun-Weien_US
dc.contributor.authorLin, Shih-Yenen_US
dc.date.accessioned2018-08-21T05:53:38Z-
dc.date.available2018-08-21T05:53:38Z-
dc.date.issued2018-05-02en_US
dc.identifier.issn1944-8244en_US
dc.identifier.urihttp://dx.doi.org/10.1021/acsami.8b02394en_US
dc.identifier.urihttp://hdl.handle.net/11536/144957-
dc.description.abstractSingle-crystal antimonene flakes are observed on sapphire substrates after the postgrowth annealing procedure of amorphous antimony (Sb) droplets prepared by using molecular beam epitaxy at room temperature. The large wetting angles of the antimonene flakes to the sapphire substrate suggest that an alternate substrate should be adopted to obtain a continuous antimonene film. By using a bilayer MoS2/sapphire sample as the new substrate, a continuous and single-crystal antimonene film is obtained at a low growth temperature of 200 degrees C. The results are consistent with the theoretical prediction of the lower interface energy between antimonene and MoS2. The different interface energies of antimonene between sapphire and MoS2 surfaces lead to the selective growth of antimonene only atop MoS2 surfaces on a prepatterned MoS2/sapphire substrate. With similar sheet resistance to graphene, it is possible to use antimonene as the contact metal of 2D material devices. Compared with Au/Ti electrodes, a specific contact resistance reduction up to 3 orders of magnitude is observed by using the multilayer antimonene as the contact metal to MoS2. The lower contact resistance, the lower growth temperature, and the preferential growth to other 2D materials have made antimonene a promising candidate as the contact metal for 2D material devices.en_US
dc.language.isoen_USen_US
dc.subjectantimoneneen_US
dc.subjectconducting 2D materialsen_US
dc.subject2D material heterostructuresen_US
dc.subjectcontact resistanceen_US
dc.subjecttransistorsen_US
dc.titleSingle-Crystal Antimonene Films Prepared by Molecular Beam Epitaxy: Selective Growth and Contact Resistance Reduction of the 2D Material Heterostructureen_US
dc.typeArticleen_US
dc.identifier.doi10.1021/acsami.8b02394en_US
dc.identifier.journalACS APPLIED MATERIALS & INTERFACESen_US
dc.citation.volume10en_US
dc.citation.spage15058en_US
dc.citation.epage15064en_US
dc.contributor.department照明與能源光電研究所zh_TW
dc.contributor.departmentInstitute of Lighting and Energy Photonicsen_US
dc.identifier.wosnumberWOS:000431723400090en_US
Appears in Collections:Articles