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dc.contributor.authorPeng, Zhangbaoen_US
dc.contributor.authorGuo, Ziquanen_US
dc.contributor.authorWu, Tingzhuen_US
dc.contributor.authorZhuang, Pengen_US
dc.contributor.authorYe, Zhichengen_US
dc.contributor.authorShi, Yuanen_US
dc.contributor.authorShih, Tien-Moen_US
dc.contributor.authorLu, Yijunen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.authorChen, Zhongen_US
dc.date.accessioned2018-08-21T05:53:46Z-
dc.date.available2018-08-21T05:53:46Z-
dc.date.issued2018-04-01en_US
dc.identifier.issn2076-3417en_US
dc.identifier.urihttp://dx.doi.org/10.3390/app8040610en_US
dc.identifier.urihttp://hdl.handle.net/11536/145121-
dc.description.abstractWe have experimentally analyzed multi-azimuth degradation mechanisms that govern failures of commercially-available high-power (1 Watt) phosphor-coated white (hppc-W) light-emitting diodes (LEDs) covered with peanut-shaped lenses under three current-stress aging (CSA) conditions. Comprehensive analyses focus on photometric, chromatic, electrical, thermal and packaging characteristics. At the packaging level, (a) the decrease of the phosphor-conversion efficiency; (b) the yellow-browning of the optical lens; and (c) the darkening of the silver-coated reflective layer deposited with extraneous chemical elements (e. g., C, O, Si, Mg, and Cu, respectively) contribute collectively to the integral degradation of the optical power. By contrast, Ohmic contacts, thermal properties, and angles of maximum intensity remain unchanged after 3840 h aging in three cases. Particularly at the chip level, the formation of point defects increases the number of non-radiative recombination centers, and thus decreases the optical power during aging stages. Nevertheless, in view of the change of the ideality factor, the Mg dopant activation and the annealing effect facilitate the increase of the optical power in two specific aging stages (192 h similar to 384 h and 768 h similar to 1536 h). This work offers a systematic guidance for the development of reliable LED-based light sources in general-lighting areas.en_US
dc.language.isoen_USen_US
dc.subjectlight-emitting diodesen_US
dc.subjectfailure mechanismsen_US
dc.subjectcurrent-stress agingen_US
dc.subjectoptical poweren_US
dc.subjectreliabilityen_US
dc.titleMulti-Azimuth Failure Mechanisms in Phosphor-Coated White LEDs by Current Aging Stressesen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/app8040610en_US
dc.identifier.journalAPPLIED SCIENCES-BASELen_US
dc.citation.volume8en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000434996400137en_US
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