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dc.contributor.authorDa Sie, Yongen_US
dc.contributor.authorLin, Chun-Yuen_US
dc.contributor.authorChen, Shean-Jenen_US
dc.date.accessioned2018-08-21T05:53:51Z-
dc.date.available2018-08-21T05:53:51Z-
dc.date.issued2018-07-12en_US
dc.identifier.issn2045-2322en_US
dc.identifier.urihttp://dx.doi.org/10.1038/s41598-018-28945-2en_US
dc.identifier.urihttp://hdl.handle.net/11536/145249-
dc.description.abstractObserving dynamic micro-scale phenomena occurring at millisecond time scales, such as organism activity, micron particle flows, or any opaque object observation, requires volumetric microscopy techniques able to achieve high data acquisition rates while maintaining contrast so that measurement of fine micro-scale features is possible. In realizing this purpose, the light-field (LF) technique has already been used on three-dimensional (3D) scene capturing and even for microscopic visualizations. In studying the ability and feasibility of 3D surface morphology reconstruction via LF microscopy, we adopted a lab-made LF microscope and integrated a four-dimensional Fourier slice algorithm and a Markov random field propagation algorithm. Furthermore, for numerical comparison and quantized analysis, the Tenengrad function was utilized to calculate the average contrast of the region of interest. Reflective US Air Force targets and 3D photolithography-made micro-scaffolds coated with 50 nm nickel thin films were adopted for system alignment and calibration. The experimental results demonstrate that the developed LF microscope with the signal processing algorithms can observe the 3D surface morphology of opaque microstructures with one snapshot, and has been preliminary applied to Brownian motion observation with 30 Hz volumetric image rate.en_US
dc.language.isoen_USen_US
dc.title3D surface morphology imaging of opaque microstructures via light-field microscopyen_US
dc.typeArticleen_US
dc.identifier.doi10.1038/s41598-018-28945-2en_US
dc.identifier.journalSCIENTIFIC REPORTSen_US
dc.citation.volume8en_US
dc.contributor.department光電學院zh_TW
dc.contributor.departmentCollege of Photonicsen_US
dc.identifier.wosnumberWOS:000438343600015en_US
Appears in Collections:Articles