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dc.contributor.authorShih, Cheng Weien_US
dc.contributor.authorChin, Alberten_US
dc.date.accessioned2019-04-03T06:44:20Z-
dc.date.available2019-04-03T06:44:20Z-
dc.date.issued2017-04-25en_US
dc.identifier.issn2045-2322en_US
dc.identifier.urihttp://dx.doi.org/10.1038/s41598-017-01231-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/145431-
dc.description.abstractHigh mobility thin-film transistor (TFT) is crucial for future high resolution and fast response flexible display. Remarkably high performance TFT, made at room temperature on flexible substrate, is achieved with record high field-effect mobility (mu(FE)) of 345 cm(2)/Vs, small sub-threshold slope (SS) of 103 mV/dec, high on-current/off-current (I-ON/I-OFF) of 7 x 10(6), and a low drain-voltage (V-D) of 2 V for low power operation. The achieved mobility is the best reported data among flexible electronic devices, which is reached by novel HfLaO passivation material on nano-crystalline zinc-oxide (ZnO) TFT to improve both I-ON and I-OFF. From X-ray photoelectron spectroscopy (XPS) analysis, the non-passivated device has high OH-bonding intensity in nano-crystalline ZnO, which damage the crystallinity, create charged scattering centers, and form potential barriers to degrade mobility.en_US
dc.language.isoen_USen_US
dc.titleRemarkably High Mobility Thin-Film Transistor on Flexible Substrate by Novel Passivation Materialen_US
dc.typeArticleen_US
dc.identifier.doi10.1038/s41598-017-01231-3en_US
dc.identifier.journalSCIENTIFIC REPORTSen_US
dc.citation.volume7en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000400104200036en_US
dc.citation.woscount11en_US
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