完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Wu, Tsung-Ta | en_US |
dc.contributor.author | Huang, Wen-Hsien | en_US |
dc.contributor.author | Yang, Chih-Chao | en_US |
dc.contributor.author | Chen, Hung-Chun | en_US |
dc.contributor.author | Hsieh, Tung-Ying | en_US |
dc.contributor.author | Lin, Wei-Sheng | en_US |
dc.contributor.author | Kao, Ming-Hsuan | en_US |
dc.contributor.author | Chen, Chiu-Hao | en_US |
dc.contributor.author | Yao, Jie-Yi | en_US |
dc.contributor.author | Jian, Yi-Ling | en_US |
dc.contributor.author | Hsu, Chiung-Chih | en_US |
dc.contributor.author | Lin, Kun-Lin | en_US |
dc.contributor.author | Shen, Chang-Hong | en_US |
dc.contributor.author | Chueh, Yu-Lun | en_US |
dc.contributor.author | Shieh, Jia-Min | en_US |
dc.date.accessioned | 2019-04-03T06:44:26Z | - |
dc.date.available | 2019-04-03T06:44:26Z | - |
dc.date.issued | 2017-05-02 | en_US |
dc.identifier.issn | 2045-2322 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1038/s41598-017-01012-y | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/145447 | - |
dc.description.abstract | Development of manufacture trend for TFTs technologies has focused on improving electrical properties of films with the cost reduction to achieve commercialization. To achieve this goal, high-performance sub-50 nm TFTs-based MOSFETs with ON-current (I-on)/subthreshold swing (S.S.) of 181 mu A/mu m/107 mV/dec and 188 mu A/mu m/98 mV/dec for NMOSFETs and PMOSFETs in a monolithic 3D circuit were demonstrated by a low power with low thermal budget process. In addition, a stackable static random access memory (SRAM) integrated with TFTs-based MOSFET with static noise margins (SNM) equals to 390 mV at V-DD = 1.0 V was demonstrated. Overall processes include a low thermal budget via ultra-flat and ultra-thin poly-Si channels by solid state laser crystallization process, chemical-mechanical polishing (CMP) planarization, plasma-enhanced atomic layer deposition (ALD) gate stacking layers and infrared laser activation with a low thermal budget. Detailed material and electrical properties were investigated. The advanced 3D architecture with closely spaced inter-layer dielectrics (ILD) enables high-performance stackable MOSFETs and SRAM for power-saving IoT/mobile products at a low cost or flexible substrate. | en_US |
dc.language.iso | en_US | en_US |
dc.title | High Performance and Low power Monolithic Three-Dimensional Sub-50 nm Poly Si Thin film transistor (TFTs) Circuits | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1038/s41598-017-01012-y | en_US |
dc.identifier.journal | SCIENTIFIC REPORTS | en_US |
dc.citation.volume | 7 | en_US |
dc.citation.spage | 0 | en_US |
dc.citation.epage | 0 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | 光電工程研究所 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.contributor.department | Institute of EO Enginerring | en_US |
dc.identifier.wosnumber | WOS:000400449700043 | en_US |
dc.citation.woscount | 1 | en_US |
顯示於類別: | 期刊論文 |