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dc.contributor.authorChiu, Ming-Huien_US
dc.contributor.authorTseng, Wei-Hsuanen_US
dc.contributor.authorTang, Hao-Lingen_US
dc.contributor.authorChang, Yung-Huangen_US
dc.contributor.authorChen, Chang-Hsiaoen_US
dc.contributor.authorHsu, Wei-Tingen_US
dc.contributor.authorChang, Wen-Haoen_US
dc.contributor.authorWu, Chih-Ien_US
dc.contributor.authorLi, Lain-Jongen_US
dc.date.accessioned2018-08-21T05:54:02Z-
dc.date.available2018-08-21T05:54:02Z-
dc.date.issued2017-05-18en_US
dc.identifier.issn1616-301Xen_US
dc.identifier.urihttp://dx.doi.org/10.1002/adfm.201603756en_US
dc.identifier.urihttp://hdl.handle.net/11536/145508-
dc.description.abstractIt is critically important to characterize the band alignment in semiconductor heterojunctions (HJs) because it controls the electronic and optical properties. However, the well-known Anderson's model usually fails to predict the band alignment in bulk HJ systems due to the presence of charge transfer at the interfacial bonding. Atomically thin 2D transition metal dichalcogenide materials have attracted much attention recently since the ultrathin HJs and devices can be easily built and they are promising for future electronics. The vertical HJs based on 2D materials can be constructed via van der Waals stacking regardless of the lattice mismatch between two materials. Despite the defect-free characteristics of the junction interface, experimental evidence is still lacking on whether the simple Anderson rule can predict the band alignment of HJs. Here, the validity of Anderson's model is verified for the 2D heterojunction systems and the success of Anderson's model is attributed to the absence of dangling bonds (i.e., interface dipoles) at the van der Waal interface. The results from the work set a foundation allowing the use of powerful Anderson's rule to determine the band alignments of 2D HJs, which is beneficial to future electronic, photonic, and optoelectronic devices.en_US
dc.language.isoen_USen_US
dc.titleBand Alignment of 2D Transition Metal Dichalcogenide Heterojunctionsen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/adfm.201603756en_US
dc.identifier.journalADVANCED FUNCTIONAL MATERIALSen_US
dc.citation.volume27en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000401319100010en_US
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