完整後設資料紀錄
DC 欄位語言
dc.contributor.authorHu, Jia-Weien_US
dc.contributor.authorYang, Sheng-Hsiungen_US
dc.contributor.authorJeng, Shie-Changen_US
dc.date.accessioned2018-08-21T05:54:06Z-
dc.date.available2018-08-21T05:54:06Z-
dc.date.issued2017-08-01en_US
dc.identifier.issn0022-2461en_US
dc.identifier.urihttp://dx.doi.org/10.1007/s10853-017-1125-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/145587-
dc.description.abstractIt is observed that the anchoring of LC molecules aligned on the ZnO film depends on the surface wettability. We demonstrate that the surface wettability of ZnO films fabricated by sol-gel process can be modified by annealing. The observations using the scanning electron microscope, photoluminescence and X-ray photoelectron spectroscopy for ZnO films have shown that the annealing can modify both the morphologies and chemical compositions of ZnO films, which in turn produces influences on the surface wettability. The surface wettability of as-prepared ZnO film can be controlled from 102 degrees to 60 degrees (contact angle (CA) of water) as the annealing temperature increases from 190 to 250 degrees C. Our experimental results show that the pretilt angles of LCs on ZnO films can be modified over a wide range from 89.5 degrees to 0.5 degrees as the CA of water on the ZnO films changes from 102 degrees to 60 degrees.en_US
dc.language.isoen_USen_US
dc.titleAnnealed zinc oxide films for controlling the alignment of liquid crystalsen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s10853-017-1125-3en_US
dc.identifier.journalJOURNAL OF MATERIALS SCIENCEen_US
dc.citation.volume52en_US
dc.citation.spage9539en_US
dc.citation.epage9545en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.department照明與能源光電研究所zh_TW
dc.contributor.department影像與生醫光電研究所zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.contributor.departmentInstitute of Lighting and Energy Photonicsen_US
dc.contributor.departmentInstitute of Imaging and Biomedical Photonicsen_US
dc.identifier.wosnumberWOS:000402560600027en_US
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