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dc.contributor.authorWu, Ping-Chenen_US
dc.contributor.authorOu, Sin-Liangen_US
dc.contributor.authorHorng, Ray-Huaen_US
dc.contributor.authorWuu, Dong-Singen_US
dc.date.accessioned2019-04-03T06:44:34Z-
dc.date.available2019-04-03T06:44:34Z-
dc.date.issued2017-06-01en_US
dc.identifier.issn1943-0655en_US
dc.identifier.urihttp://dx.doi.org/10.1109/JPHOT.2017.2710019en_US
dc.identifier.urihttp://hdl.handle.net/11536/145634-
dc.description.abstractHigh-voltage light-emitting diodes (HV-LEDs) were prepared with 4 x 2 microcells. A novel technique for enhancing the light extraction of HV-LEDs by using wet-etched chamfer structures in the sidewalls of each cell is proposed. The thicknesses of the u-GaN layers used were in the range of 3-7 mu m. Simulations revealed that the light extraction of the HV-LEDs with chamfer structures would be enhanced by increasing the u-GaN thickness. The output power (@ 80 mA) of the HV-LEDs without chamfer structures was 538.0-539.1 mW. However, the output powers (@ 80 mA) of the HV-LEDs with chamfer structures and u-GaN thicknesses of 3, 5, and 7 mu m were increased to 555.3, 573.1, and 561.6 mW, respectively. The 7 mu m thick u-GaN layer led to an extremely large thickness of the HV-LED epitaxial structure, which caused difficulties during the wet etching process. Because of the apparent decrease in the wet etching rate of GaN, the damages to the epitaxial structures of the HV-LED with the 7 mu m thick u-GaN was more obvious. Therefore, the device's light extraction was slightly reduced. The results confirm that chamfer structures are highly useful for improving the performance of HV-LEDs, especially for the u-GaN thickness of 5 mu m.en_US
dc.language.isoen_USen_US
dc.subjectHigh-voltage light emitting diodesen_US
dc.subjectsidewall chamfer structureen_US
dc.subjectwet etchingen_US
dc.subjectTrace-Pro simulationen_US
dc.subjectlight extractionen_US
dc.titleEnhanced Light Extraction of High-Voltage Light Emitting Diodes Using a Sidewall Chamfer Structureen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/JPHOT.2017.2710019en_US
dc.identifier.journalIEEE PHOTONICS JOURNALen_US
dc.citation.volume9en_US
dc.citation.issue3en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000403436100001en_US
dc.citation.woscount1en_US
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