完整後設資料紀錄
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dc.contributor.authorHwang, Sooyeonen_US
dc.contributor.authorMeng, Qingpingen_US
dc.contributor.authorChen, Ping-Fanen_US
dc.contributor.authorKisslinger, Kimen_US
dc.contributor.authorCen, Jiajieen_US
dc.contributor.authorOrlov, Alexanderen_US
dc.contributor.authorZhu, Yimeien_US
dc.contributor.authorStach, Eric A.en_US
dc.contributor.authorChu, Ying-Haoen_US
dc.contributor.authorSu, Dongen_US
dc.date.accessioned2018-08-21T05:54:12Z-
dc.date.available2018-08-21T05:54:12Z-
dc.date.issued2017-06-26en_US
dc.identifier.issn1433-7851en_US
dc.identifier.urihttp://dx.doi.org/10.1002/anie.201703168en_US
dc.identifier.urihttp://hdl.handle.net/11536/145665-
dc.description.abstractLithiation/delithiation induces significant stresses and strains into the electrodes for lithium ion batteries, which can severely degrade their cycling performance. Moreover, this electrochemically induced strain can interact with the local strain existing at solid-solid interfaces. It is not clear how this interaction affects the lithiation mechanism. The effect of this coupling on the lithiation kinetics in epitaxial Fe3O4 thin film on a Nb-doped SrTiO3 substrate is investigated. In situ and ex situ transmission electron microscopy (TEM) results show that the lithiation is suppressed by the compressive interfacial strain. At the interface between the film and substrate, the existence of LixFe(3)O(4) rock-salt phase during lithiation consequently restrains the film from delamination. 2D phase-field simulation verifies the effect of strain. This work provides critical insights of understanding the solid-solid interfaces of conversion-type electrodes.en_US
dc.language.isoen_USen_US
dc.subjectconversion electrodesen_US
dc.subjectlithiationen_US
dc.subjectmagnetiteen_US
dc.subjectstrainen_US
dc.subjectthin filmsen_US
dc.titleStrain Coupling of Conversion-type Fe3O4 Thin Films for Lithium Ion Batteriesen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/anie.201703168en_US
dc.identifier.journalANGEWANDTE CHEMIE-INTERNATIONAL EDITIONen_US
dc.citation.volume56en_US
dc.citation.spage7813en_US
dc.citation.epage7816en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000403839000020en_US
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