完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Nguyen, T. N. | en_US |
dc.contributor.author | Lee, Y. M. | en_US |
dc.contributor.author | Wu, J. S. | en_US |
dc.contributor.author | Lin, M. C. | en_US |
dc.date.accessioned | 2018-08-21T05:54:14Z | - |
dc.date.available | 2018-08-21T05:54:14Z | - |
dc.date.issued | 2017-07-01 | en_US |
dc.identifier.issn | 0272-4324 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1007/s11090-017-9825-7 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/145700 | - |
dc.description.abstract | The thermal unimolecular decomposition of SiH4 (+) ion and its related reverse reactions, SiH3 (+) + H and SiH2 (+) + H-2, have been investigated by ab initio molecular orbital and quantum statistical variational RRKM theory calculations. The potential energy surface has been calculated at different levels of theory; the results at the highest level, CCSD(T)/CBS//CCSD(T)/6-311++G(3df,2p), show that the decomposition of SiH4 (+) can mainly occur via a barrierless channel giving SiH2 (+) + H-2 lying 11.8 kcal/mol above the reactant, or via a transition state forming SiH3 (+)center dot center dot center dot H complex to be followed by a barrierless decomposition yielding SiH3 (+) + H lying 23.5 kcal/mol above the reactant. Barrierless processes were calculated using the CASPT2 and CASSCF methods with the 6-311++G(3df,2p) basis set and fitted with Morse potentials. The rate constants were predicted by solving master equations based on the RRKM theory at the E,J-resolved level; the results show that the channel SiH4 (+) -> SiH2 (+) + H-2 is predominate under PEVCD conditions. For H- and H-2-capturing by SiH3 (+) and SiH2 (+) ions, respectively, the rate constants were found to be weakly dependent on temperature at the high-pressure limit and decrease rapidly with pressure. The calculated heats of formation of the SiH (x) (+) (x = 2-4) ions are in close agreement with available thermochemical data. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | PECVD | en_US |
dc.subject | Silicon thin film | en_US |
dc.subject | SiH4+ | en_US |
dc.subject | Mechanism | en_US |
dc.subject | Kinetics | en_US |
dc.title | Ab Initio Chemical Kinetics for the Thermal Decomposition of SiH4 (+) Ion and Related Reverse Ion-Molecule Reactions of Interest to PECVD of a-Si:H Films | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1007/s11090-017-9825-7 | en_US |
dc.identifier.journal | PLASMA CHEMISTRY AND PLASMA PROCESSING | en_US |
dc.citation.volume | 37 | en_US |
dc.citation.spage | 1249 | en_US |
dc.citation.epage | 1264 | en_US |
dc.contributor.department | 機械工程學系 | zh_TW |
dc.contributor.department | 應用化學系 | zh_TW |
dc.contributor.department | Department of Mechanical Engineering | en_US |
dc.contributor.department | Department of Applied Chemistry | en_US |
dc.identifier.wosnumber | WOS:000404182500021 | en_US |
顯示於類別: | 期刊論文 |