完整後設資料紀錄
DC 欄位語言
dc.contributor.authorNguyen, T. N.en_US
dc.contributor.authorLee, Y. M.en_US
dc.contributor.authorWu, J. S.en_US
dc.contributor.authorLin, M. C.en_US
dc.date.accessioned2018-08-21T05:54:14Z-
dc.date.available2018-08-21T05:54:14Z-
dc.date.issued2017-07-01en_US
dc.identifier.issn0272-4324en_US
dc.identifier.urihttp://dx.doi.org/10.1007/s11090-017-9825-7en_US
dc.identifier.urihttp://hdl.handle.net/11536/145700-
dc.description.abstractThe thermal unimolecular decomposition of SiH4 (+) ion and its related reverse reactions, SiH3 (+) + H and SiH2 (+) + H-2, have been investigated by ab initio molecular orbital and quantum statistical variational RRKM theory calculations. The potential energy surface has been calculated at different levels of theory; the results at the highest level, CCSD(T)/CBS//CCSD(T)/6-311++G(3df,2p), show that the decomposition of SiH4 (+) can mainly occur via a barrierless channel giving SiH2 (+) + H-2 lying 11.8 kcal/mol above the reactant, or via a transition state forming SiH3 (+)center dot center dot center dot H complex to be followed by a barrierless decomposition yielding SiH3 (+) + H lying 23.5 kcal/mol above the reactant. Barrierless processes were calculated using the CASPT2 and CASSCF methods with the 6-311++G(3df,2p) basis set and fitted with Morse potentials. The rate constants were predicted by solving master equations based on the RRKM theory at the E,J-resolved level; the results show that the channel SiH4 (+) -> SiH2 (+) + H-2 is predominate under PEVCD conditions. For H- and H-2-capturing by SiH3 (+) and SiH2 (+) ions, respectively, the rate constants were found to be weakly dependent on temperature at the high-pressure limit and decrease rapidly with pressure. The calculated heats of formation of the SiH (x) (+) (x = 2-4) ions are in close agreement with available thermochemical data.en_US
dc.language.isoen_USen_US
dc.subjectPECVDen_US
dc.subjectSilicon thin filmen_US
dc.subjectSiH4+en_US
dc.subjectMechanismen_US
dc.subjectKineticsen_US
dc.titleAb Initio Chemical Kinetics for the Thermal Decomposition of SiH4 (+) Ion and Related Reverse Ion-Molecule Reactions of Interest to PECVD of a-Si:H Filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s11090-017-9825-7en_US
dc.identifier.journalPLASMA CHEMISTRY AND PLASMA PROCESSINGen_US
dc.citation.volume37en_US
dc.citation.spage1249en_US
dc.citation.epage1264en_US
dc.contributor.department機械工程學系zh_TW
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.identifier.wosnumberWOS:000404182500021en_US
顯示於類別:期刊論文