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dc.contributor.authorLin, Tingyouen_US
dc.contributor.authorHo, Yingchiehen_US
dc.contributor.authorSu, Chauchinen_US
dc.date.accessioned2019-04-03T06:43:15Z-
dc.date.available2019-04-03T06:43:15Z-
dc.date.issued2017-06-01en_US
dc.identifier.issn1424-8220en_US
dc.identifier.urihttp://dx.doi.org/10.3390/s17061397en_US
dc.identifier.urihttp://hdl.handle.net/11536/145734-
dc.description.abstractThis paper presents a method of thermal balancing for monolithic power integrated circuits (ICs). An on-chip temperature monitoring sensor that consists of a poly resistor strip in each of multiple parallel MOSFET banks is developed. A temperature-to-frequency converter (TFC) is proposed to quantize on-chip temperature. A pulse-width-modulation (PWM) methodology is developed to balance the channel temperature based on the quantization. The modulated PWM pulses control the hottest of metal-oxide-semiconductor field-effect transistor (MOSFET) bank to reduce its power dissipation and heat generation. A test chip with eight parallel MOSFET banks is fabricated in TSMC 0.25 mu m HV BCD processes, and total area is 900 x 914 mu m(2). The maximal temperature variation among the eight banks can reduce to 2.8 degrees C by the proposed thermal balancing system from 9.5 degrees C with 1.5 W dissipation. As a result, our proposed system improves the lifetime of a power MOSFET by 20%.en_US
dc.language.isoen_USen_US
dc.subjectmonolithic power ICsen_US
dc.subjecttemperature sensoren_US
dc.subjectoscillatoren_US
dc.subjectthermal balancingen_US
dc.subjectpower metal-oxide-semiconductor (MOS)en_US
dc.subjectcalibrationen_US
dc.titleLDMOS Channel Thermometer Based on a Thermal Resistance Sensor for Balancing Temperature in Monolithic Power ICsen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/s17061397en_US
dc.identifier.journalSENSORSen_US
dc.citation.volume17en_US
dc.citation.issue6en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000404553900213en_US
dc.citation.woscount1en_US
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