RF loss mechanisms in GaN-based high-electron-mobility-transistor on silicon: Role of an inversion channel at the AlN/Si interface

Abstract

One of the epitaxial issues pertaining to the growth of AlGaN/GaN HEMTs on Si is the decrease of parasitic losses that can adversely impact the RF device performances. We characterized the microwave losses in coplanar waveguides (CPWs) on GaN-based high-electron-mobility-transistors (HEMTs) and their buffer layers on Silicon substrate, up to 40GHz. The RF losses depend not only on the crystalline quality but also on the residual tensile stress in AlN buffer, as well as its thickness. The mechanism of interfacial lossy channel induced by the piezoelectric field is discussed. Adopting a thin high-low-high temperature (HLH) AlN buffer can help to reduce the tensile stress leading to a reduction of RF losses. We suggest that a thinner p-type AlN and/or p-AlGaN-on-thin AlN near the interface can suppress the electron interfacial lossy channel, which helps the GaN-HEMT-on-HR Si to remain in a high frequency range and at high-temperature operation. (C) 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim