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dc.contributor.authorChiang, Che-Wenen_US
dc.contributor.authorLin, Ping-Chunen_US
dc.contributor.authorYang, Kei-Hsiungen_US
dc.date.accessioned2018-08-21T05:54:24Z-
dc.date.available2018-08-21T05:54:24Z-
dc.date.issued2017-08-10en_US
dc.identifier.issn1671-7694en_US
dc.identifier.urihttp://dx.doi.org/10.3788/COL201715.081203en_US
dc.identifier.urihttp://hdl.handle.net/11536/145900-
dc.description.abstractThe pretilt angle of a twisted nematic (TN) liquid crystal display has a strong effect on viewing angles and response times of the display as well as shifting the light-leaking disclination lines into the black-matrix area within pixels of a thin-film-transistor driven TN panel for a high contrast ratio. In this Letter, we develop an optical method to determine the TN pretilt angle based on heterodyne measurements of the phase versus the incident angle of a thin TN cell subjected to out-of-plane rotations. We believe that our method of measuring phases has advantages of simpler setup and calculations, better stability, and less sensitive to ambient electromagnetic interference than the commonly used method of measuring intensities.en_US
dc.language.isoen_USen_US
dc.titleEntanglement-free determination of pretilt angles of twisted nematic liquid-crystal cells by phase measurementen_US
dc.typeArticleen_US
dc.identifier.doi10.3788/COL201715.081203en_US
dc.identifier.journalCHINESE OPTICS LETTERSen_US
dc.citation.volume15en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.department影像與生醫光電研究所zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.contributor.departmentInstitute of Imaging and Biomedical Photonicsen_US
dc.identifier.wosnumberWOS:000407438600013en_US
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