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dc.contributor.authorTuan, Wei-Hsingen_US
dc.contributor.authorChou, Chen-Chiaen_US
dc.contributor.authorTseng, Tseung-Yuenen_US
dc.contributor.authorWang, Sea-Fueen_US
dc.contributor.authorTseng, Wen-Jeaen_US
dc.contributor.authorShieh, Jayen_US
dc.contributor.authorHuang, Chi-Yuenen_US
dc.contributor.authorChen, Jhewn-Kuangen_US
dc.date.accessioned2018-08-21T05:54:29Z-
dc.date.available2018-08-21T05:54:29Z-
dc.date.issued2017-01-01en_US
dc.identifier.issn0272-8842en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.ceramint.2017.07.048en_US
dc.identifier.urihttp://hdl.handle.net/11536/146022-
dc.language.isoen_USen_US
dc.titlePrefaceen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.ceramint.2017.07.048en_US
dc.identifier.journalCERAMICS INTERNATIONALen_US
dc.citation.volume43en_US
dc.citation.issue1en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000409285800001en_US
Appears in Collections:Articles