標題: Developing a Phase and Intensity Measurement Technique with Multiple Incident Angles under Surface Plasmon Resonance Condition
作者: Han, Chien-Yuan
You, Du Cheng
Chen, Yi-Ren
Chao, Yu-Faye
光電工程學系
Department of Photonics
關鍵字: focused beam;ellipsometry;surface plasmon resonance
公開日期: 1-一月-2013
摘要: This work presents the application of a focused beam polarizer-sample-analyzer imaging ellipsometer in measuring the ellipsometric parameters under the surface plasmon resonance condition. By using a cylindrical lens to produce fan shaped beam with multiple incident angles, three-intensity measurement technique can measure the ellipsometric parameters against each incidence but without the need of calibrating the azimuth errors of polarizer and analyzer. As a result of multiple incident angles approach, the whole SPR curve can be obtained without rotating the sensor chip. The intensity and phase response in the air and water interface of the sensor chip were demonstrated, and almost all measured results are close to the theoretical model.
URI: http://dx.doi.org/10.1117/12.2035029
http://hdl.handle.net/11536/146357
ISBN: 978-0-8194-9774-1
ISSN: 0277-786X
DOI: 10.1117/12.2035029
期刊: INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2013: LASER SENSING AND IMAGING AND APPLICATIONS
Volume: 8905
起始頁: 0
結束頁: 0
顯示於類別:會議論文


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