標題: Nonlinear Behavior Characterization of RF Active Devices Using Impedance-dependence X-parameters
作者: Chiu, Chia-Sung
Lin, Shu-Yu
Chen, Bo-Yuan
Chen, Kun-Ming
Huang, Guo-Wei
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Nonlinear;Polyharmonic distortion model;X-parameters;NVNA
公開日期: 1-一月-2010
摘要: This paper presents a nonlinear characterization of active device using polyharmonic distortion model formed by X-parameters. By means of the Polyharmonic distortion model characterized via nonlinear vector network analyzer makes it possible to achieve a good agreement between measured and simulated data in terms of power gain and intermodulation. Furthermore, large-signal validation of this model via X-parameters also shows a good match with measurements in RF LDMOS transistor without optimization. Results show that the X-parameters from nonlinear vector network analyzer appear to be a better method for nonlinear characterization.
URI: http://hdl.handle.net/11536/146402
期刊: 2010 ASIA-PACIFIC MICROWAVE CONFERENCE
起始頁: 2307
結束頁: 2310
顯示於類別:會議論文