完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hsu, C. H. | en_US |
dc.contributor.author | Hsu, Y. P. | en_US |
dc.contributor.author | Yao, F. H. | en_US |
dc.contributor.author | Huang, Y. T. | en_US |
dc.contributor.author | Tsai, C. C. | en_US |
dc.contributor.author | Zan, H. W. | en_US |
dc.contributor.author | Bi, C. C. | en_US |
dc.contributor.author | Lu, C. H. | en_US |
dc.contributor.author | Yeh, C. H. | en_US |
dc.date.accessioned | 2018-08-21T05:56:37Z | - |
dc.date.available | 2018-08-21T05:56:37Z | - |
dc.date.issued | 2010-01-01 | en_US |
dc.identifier.issn | 0272-9172 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1557/PROC-1245-A21-05 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/146427 | - |
dc.description.abstract | The crystallinity of the hydrogenated microcrystalline silicon (mu c-Si:H) film was known to influence the solar cell efficiency greatly. Also hydrogen was found to play a critical role in controlling the crystallinity. Instead of employing conventional plasma deposition techniques, this work focused on using catalytic chemical vapor deposition (Cat-CVD) to study the effect of hydrogen dilution and the filament-to-substrate distance on the crystallinity, deposition rate, microstructure factor and electrical property of the mu c-Si: H film. We found that the substrate material and structure can affect the crystallinity of the mu c-Si: H film and the incubation effect. Comparing bare glass, TCO-coated glass, a-Si: H-coated glass and mu c-Si: H-coated glass, the microcrystalline phase grows the fastest onto mu c-Si: H surface, but the slowest onto a-Si: H surface. Surprisingly, the template effect lasted for more than a thousand atomic layers of silicon. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Study of Crystallinity in mu c-Si: H Films Deposited by Cat-CVD for Thin Film Solar Cell Applications | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.doi | 10.1557/PROC-1245-A21-05 | en_US |
dc.identifier.journal | AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY - 2010 | en_US |
dc.citation.volume | 1245 | en_US |
dc.citation.spage | 465 | en_US |
dc.citation.epage | 470 | en_US |
dc.contributor.department | 交大名義發表 | zh_TW |
dc.contributor.department | National Chiao Tung University | en_US |
dc.identifier.wosnumber | WOS:000395264900064 | en_US |
顯示於類別: | 會議論文 |