Investigation of Degradation of Single-Cell PV Module by Pressure Cooker Test and Damp Heat Test

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Tung, Chao-Ming	en_US
dc.contributor.author	Li, Yu-Tai	en_US
dc.contributor.author	Yang, Wei-Lun	en_US
dc.contributor.author	Wu, Hung-Sen	en_US
dc.contributor.author	Yu, Peichen	en_US
dc.date.accessioned	2018-08-21T05:56:42Z	-
dc.date.available	2018-08-21T05:56:42Z	-
dc.date.issued	2016-01-01	en_US
dc.identifier.issn	0160-8371	en_US
dc.identifier.uri	http://hdl.handle.net/11536/146531	-
dc.description.abstract	Accelerated methods for evaluating thermo humidity resistance of single-cell PV module are demonstrated with standard damp heat test (DH) and non-standard pressure cooker test (PCT). We investigated the failure mechanism of PCT. Our result shows testing under PCT more than 121 degrees C has fast degradation compared to other condition.	en_US
dc.language.iso	en_US	en_US
dc.title	Investigation of Degradation of Single-Cell PV Module by Pressure Cooker Test and Damp Heat Test	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)	en_US
dc.citation.spage	935	en_US
dc.citation.epage	937	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.identifier.wosnumber	WOS:000399818700212	en_US
顯示於類別：	會議論文