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dc.contributor.authorTung, Chao-Mingen_US
dc.contributor.authorLi, Yu-Taien_US
dc.contributor.authorYang, Wei-Lunen_US
dc.contributor.authorWu, Hung-Senen_US
dc.contributor.authorYu, Peichenen_US
dc.date.accessioned2018-08-21T05:56:42Z-
dc.date.available2018-08-21T05:56:42Z-
dc.date.issued2016-01-01en_US
dc.identifier.issn0160-8371en_US
dc.identifier.urihttp://hdl.handle.net/11536/146531-
dc.description.abstractAccelerated methods for evaluating thermo humidity resistance of single-cell PV module are demonstrated with standard damp heat test (DH) and non-standard pressure cooker test (PCT). We investigated the failure mechanism of PCT. Our result shows testing under PCT more than 121 degrees C has fast degradation compared to other condition.en_US
dc.language.isoen_USen_US
dc.titleInvestigation of Degradation of Single-Cell PV Module by Pressure Cooker Test and Damp Heat Testen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)en_US
dc.citation.spage935en_US
dc.citation.epage937en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000399818700212en_US
Appears in Collections:Conferences Paper