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dc.contributor.authorChou, Chia-Chingen_US
dc.contributor.authorChen, Tsan-Yuen_US
dc.contributor.authorFang, Wai-Chien_US
dc.date.accessioned2018-08-21T05:56:43Z-
dc.date.available2018-08-21T05:56:43Z-
dc.date.issued2016-01-01en_US
dc.identifier.issn2163-4025en_US
dc.identifier.urihttp://hdl.handle.net/11536/146563-
dc.description.abstractThis paper presents an automatic muscle artifacts removal system for multi-channel electroencephalogram (EEG) applications. Since EEG signals are very weak and highly sensitive to the environment, they are easily contaminated by noises and artifacts. To get clean and usable EEG signals for brain-computer interface (BCI) applications, we should acquire these signals from the human brain without artifacts. Recently, Blind Source Separation (BSS) technique based on Canonical Correlation Analysis (CCA) was proposed to reconstruct clean EEG signals from recordings by removing muscle artifacts components. To enhance the feasibility and reliability of BCIs, EEG processing systems used for BCIs should be more portable and signals should be acquired in real-time without artifacts. To match with these requirements, a hardware design of the artifacts removal system is adopted for artifacts extraction. The performance of eye-blink and muscle artifacts elimination is evaluated through the correlation coefficients between processed and pure EEG signals. The experimental results show that the average correlation coefficients for eye-blink and muscle elimination are 0.9341 and 0.8927 respectively.en_US
dc.language.isoen_USen_US
dc.subjectEEGen_US
dc.subjectBSS-CCAen_US
dc.subjectArtifacten_US
dc.subjectMuscle artifact removalen_US
dc.titleFPGA Implementation of EEG System-on-Chip with Automatic Artifacts Removal based on BSS-CCA Methoden_US
dc.typeProceedings Paperen_US
dc.identifier.journalPROCEEDINGS OF 2016 IEEE BIOMEDICAL CIRCUITS AND SYSTEMS CONFERENCE (BIOCAS)en_US
dc.citation.spage224en_US
dc.citation.epage227en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000401795900063en_US
Appears in Collections:Conferences Paper