標題: Integrating SPC/EPC, ICA and neural networks to develop an identification technique
作者: Lu, Chih He
Yu, Chun Yuan
Chiu, Chih Chou
經營管理研究所
Institute of Business and Management
關鍵字: statistical process control;engineering process control;independent component analysis;neural networks;identification of process disturbance
公開日期: 1-一月-2006
摘要: There are many studies have been conducted to the integrated use of statistical process control (SPC) and engineering process control (EPC) because using them individually cannot optimally control the manufacturing process. The majority of these studies have reported that the integrated approach has better performance than that by using only SPC or EPC. Among all these studies, most of them have assumed that the assignable causes of process disturbance can be effectively identified and removed by SPC techniques. However, these techniques are typically time-consuming and thus make the search hard to implement in practice. The paper discusses the development of neural network models with independent component analysis (ICA) to identify the disturbance and recognize shifts in the correlated process parameters. Moreover, these designed network models can be used to monitor and eliminate manufacturing process parameters when disturbance happens in the underlying process. As the results reveal, the shift of disturbance can be identified successfully by the proposed approach.
URI: http://hdl.handle.net/11536/146622
期刊: WMSCI 2006: 10TH WORLD MULTI-CONFERENCE ON SYSTEMICS, CYBERNETICS AND INFORMATICS, VOL VI, PROCEEDINGS
起始頁: 244
顯示於類別:會議論文