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dc.contributor.authorLu, Chih Heen_US
dc.contributor.authorYu, Chun Yuanen_US
dc.contributor.authorChiu, Chih Chouen_US
dc.date.accessioned2018-08-21T05:56:46Z-
dc.date.available2018-08-21T05:56:46Z-
dc.date.issued2006-01-01en_US
dc.identifier.urihttp://hdl.handle.net/11536/146622-
dc.description.abstractThere are many studies have been conducted to the integrated use of statistical process control (SPC) and engineering process control (EPC) because using them individually cannot optimally control the manufacturing process. The majority of these studies have reported that the integrated approach has better performance than that by using only SPC or EPC. Among all these studies, most of them have assumed that the assignable causes of process disturbance can be effectively identified and removed by SPC techniques. However, these techniques are typically time-consuming and thus make the search hard to implement in practice. The paper discusses the development of neural network models with independent component analysis (ICA) to identify the disturbance and recognize shifts in the correlated process parameters. Moreover, these designed network models can be used to monitor and eliminate manufacturing process parameters when disturbance happens in the underlying process. As the results reveal, the shift of disturbance can be identified successfully by the proposed approach.en_US
dc.language.isoen_USen_US
dc.subjectstatistical process controlen_US
dc.subjectengineering process controlen_US
dc.subjectindependent component analysisen_US
dc.subjectneural networksen_US
dc.subjectidentification of process disturbanceen_US
dc.titleIntegrating SPC/EPC, ICA and neural networks to develop an identification techniqueen_US
dc.typeProceedings Paperen_US
dc.identifier.journalWMSCI 2006: 10TH WORLD MULTI-CONFERENCE ON SYSTEMICS, CYBERNETICS AND INFORMATICS, VOL VI, PROCEEDINGSen_US
dc.citation.spage244en_US
dc.contributor.department經營管理研究所zh_TW
dc.contributor.departmentInstitute of Business and Managementen_US
dc.identifier.wosnumberWOS:000251938300043en_US
Appears in Collections:Conferences Paper