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dc.contributor.authorKuo, Chun-Chiehen_US
dc.contributor.authorHsieh, Jen-Weien_US
dc.contributor.authorChang, Li-Pinen_US
dc.date.accessioned2018-08-21T05:56:53Z-
dc.date.available2018-08-21T05:56:53Z-
dc.date.issued2011-01-01en_US
dc.identifier.issn1533-2306en_US
dc.identifier.urihttp://dx.doi.org/10.1109/RTCSA.2011.76en_US
dc.identifier.urihttp://hdl.handle.net/11536/146778-
dc.description.abstractSolid-state disks use flash memory as their storage medium, and adopt a firmware layer that makes data mapping and wear leveling transparent to the hosts. Even though solid-state disks emulate a collection of logical sectors, the I/O delays of accessing all these logical sectors are not uniform because the management of flash memory is subject to many physical constraints of flash memory. This work proposes a collection of black-box tests can detect the geometry inside of a solid-state disk. The host system software can arrange data in the logical disk space according to the detected geometry information to match the host write pattern with the device characteristic for reducing the flash management overhead in solid-state disks.en_US
dc.language.isoen_USen_US
dc.titleDetecting Solid-State Disk Geometry for Write Pattern Optimizationen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/RTCSA.2011.76en_US
dc.identifier.journal2011 IEEE 17TH INTERNATIONAL CONFERENCE ON EMBEDDED AND REAL-TIME COMPUTING SYSTEMS AND APPLICATIONS (RTCSA 2011), VOL 2en_US
dc.citation.spage89en_US
dc.citation.epage94en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000410202500014en_US
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