完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lin, Hsuan | en_US |
dc.contributor.author | Lin, Chia-Hsien | en_US |
dc.contributor.author | Lai, Wei-Chen | en_US |
dc.contributor.author | Lee, Yi-Shan | en_US |
dc.contributor.author | Lin, Sheng-Di | en_US |
dc.contributor.author | Chang, Wen-Hao | en_US |
dc.date.accessioned | 2019-04-03T06:35:46Z | - |
dc.date.available | 2019-04-03T06:35:46Z | - |
dc.date.issued | 2011-11-01 | en_US |
dc.identifier.issn | 1098-0121 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1103/PhysRevB.84.201301 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/14680 | - |
dc.description.abstract | We present the control of couplings between quantum dots and cavity modes in microdisk microcavities by a stress tuning scheme. The excitonic transitions and cavity modes can be brought into resonance due to their different energy shift rates with the applied strain. Spectral signatures of both strong and weak couplings are clearly observed. The strain tunable device can be used to tune the exciton wavelength bidirectionally at constant temperatures without significantly affecting the emission rate and linewidth of excitons. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Stress tuning of strong and weak couplings between quantum dots and cavity modes in microdisk microcavities | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1103/PhysRevB.84.201301 | en_US |
dc.identifier.journal | PHYSICAL REVIEW B | en_US |
dc.citation.volume | 84 | en_US |
dc.citation.issue | 20 | en_US |
dc.citation.spage | 0 | en_US |
dc.citation.epage | 0 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000296874700001 | en_US |
dc.citation.woscount | 8 | en_US |
顯示於類別: | 期刊論文 |