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dc.contributor.authorFang, LTen_US
dc.contributor.authorChen, HCen_US
dc.contributor.authorYin, ICen_US
dc.contributor.authorWang, SJen_US
dc.contributor.authorWen, CHen_US
dc.contributor.authorKuo, CHen_US
dc.date.accessioned2018-08-21T05:56:59Z-
dc.date.available2018-08-21T05:56:59Z-
dc.date.issued2006-01-01en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://dx.doi.org/10.1117/12.650686en_US
dc.identifier.urihttp://hdl.handle.net/11536/146899-
dc.description.abstractIn this paper, we propose an automatic inspection system, which can automatically detect four types of muras on an LCD panel: cluster mura, v-band mura, rubbing mura, and light leakage mura. To detect cluster muras, the Laplacian of Gaussian (LOG) filter is used. A multi-resolution approach is proposed to detect cluster muras of different scales. To speed up the processing speed, this multi-resolution approach is actually implemented in the frequency domain. To detect v-band muras, we check the variation tendency of the projected I-D intensity profile. Then, v-band muras are detected by identifying these portions of the I-D profile where a large deviation occurs. To detect rubbing muras, we designed a frequency mask to detect distinct components in the frequency domain. To detect light leak muras, we apply image mirroring over the boundary parts and adopt the same LOG filter that has been used in detecting cluster muras. All four types of mura detection are integrated together in an efficient way and simulation results demonstrate that this system is indeed very helpful in detecting mura defects.en_US
dc.language.isoen_USen_US
dc.subjectLaplacian of Gaussianen_US
dc.subjectMura defecten_US
dc.subjectMura detectionen_US
dc.subjectSEMUen_US
dc.subjectautomatic inspectionen_US
dc.titleAutomatic mura detection system for liquid crystal display panelsen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.650686en_US
dc.identifier.journalMACHINE VISION APPLICATIONS IN INDUSTRIAL INSPECTION XIVen_US
dc.citation.volume6070en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000236912300016en_US
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